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i.MX35 Automotive Quality Assurance
Automotive Design
3.3 V I/O; Standard SDRAM and DDR2
CAN, MLB, embedded USB PHY
Automotive Test Methodology (ZeroDefect)
·
High voltage stress test (HVST);
·
Tri-temp (-40, 25, 85C Ta) "safe" production launch
Continuous Improvement
·
Zero PPM only acceptable target
·
Freescale standard CQI practices with returned units
·
Use all available data for PPM elimination
Reliability Evaluation per AEC Grade 3 and FSL Auto Guidelines
Summary :
· Tri-temp (-40, 25, 85C Ta) "safe" production launch Continuous Improvement · Zero PPM only acceptable target · Freescale standard CQI practices with returned units · Use all available data for PPM elimination Reliability Evaluation per AEC Grade 3 and FSL Auto Guidelines
Tags :
freescale,automotie,inc,standard,semiconductor,all,test,ppm,high,ddr2,cqi,product,fsl